Company record
Solarius Development, Inc. designs and builds vision‑ and laser‑based non‑contact surface metrology systems that achieve sub‑micron accuracy. Its automated and semi‑automated tools can perform wet or dry thick‑film height measurements, assess texture, form and wear on metal parts, and determine height and volume of solder‑paste deposits. The equipment also supports skin‑structure characterization, flatness and coplanarity checks of electronic components, and wall‑height and edge detection for MEMS devices. All instruments are modular, making them suitable for quality‑control, research‑and‑development, and manufacturing settings. The 3‑D systems are engineered for flexibility, allowing adaptation to specific customer specifications. Operation is software‑driven, providing integrated data‑acquisition and topography‑analysis capabilities.
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