Company record
J.A. Woollam Co., Inc. provides spectroscopic ellipsometers that enable non‑destructive analysis of both thin‑film and bulk materials. The instruments support evaluation of dielectrics, semiconductors, polymers, metals and liquids. Their service portfolio covers a spectral measurement window from 142 nm up to 33 µm, includes customer training, precise thin‑film thickness and optical‑property measurement, performance testing, and spatial sample mapping.
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