Company record
k‑Space Associates, Inc. designs and builds in‑line, in‑situ and ex‑situ metrology equipment for the glass, solar, automotive, semiconductor, thin‑film and related industries. Its product portfolio includes non‑contact inspection tools that employ machine‑vision to detect defects and evaluate surface quality, as well as systems that measure dimensional characteristics, emissivity, thin‑film temperature, stress, curvature, bow, deposition rate, thickness, reflectivity, spectral reflectance, transmission, and conduct Reflection High Energy Electron Diffraction (RHEED) analysis. The company also offers custom‑engineered solutions tailored to specific customer requirements.
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