Company record
Ion-Tof USA, Inc. provides surface‑analysis instrumentation, delivering Time‑of‑Flight Secondary Ion Mass Spectrometry (TOF‑SIMS) and High‑Sensitivity Low‑Energy Ion Scattering (HS‑LEIS) systems. Its portfolio enables surface spectrometry, depth profiling and three‑dimensional analysis, serving customers in the semiconductor, glass, polymer and bio‑materials sectors.
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