Company record
Applied Research & Photonics, Inc. designs and produces spectrometer systems that incorporate a sub‑surface nano‑scanner and three‑dimensional imager. The equipment enables non‑contact, non‑destructive analysis at ambient temperature, delivering sub‑nanometer spatial resolution. It supports time‑domain measurements ranging from sub‑picosecond intervals up to several tens of picoseconds, which corresponds to an effective frequency bandwidth of roughly 0.1 to 30 THz. In addition to hardware, the company offers nano‑scanning material characterization and testing services tailored to semiconductor and nanomaterial research and manufacturing. These services can be applied to semiconductor wafers, various nanomaterials, soft matter, and nano‑composite structures. Customers in research, testing and inspection sectors rely on these capabilities.
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