Company record
Materials Research Laboratories, Inc. delivers comprehensive material analysis services, encompassing auger electron spectroscopy, metallography, X‑ray photoelectron spectroscopy, scanning electron microscopy, ion scattering spectroscopy, both energy‑ and wavelength‑dispersive X‑ray spectroscopies, residual gas analysis, and infrared spectroscopy. The laboratory’s in‑house instrumentation includes high‑resolution scanning auger microscopy, transmission electron microscopy, wavelength‑dispersive X‑ray spectroscopy, ultraviolet/visible/near‑infrared spectroscopy, light microscopy, microtomy, gas chromatography, thermal analysis, physical testing, X‑ray diffraction, and its own X‑ray photoelectron spectroscopy capability. Quadrupole‑based mass spectrometers provide unity‑resolution identification of molecular fragments and can reconstruct the original chemical structure of a gas sample. Ion scattering spectroscopy is employed to examine monolayer films, delivering data on molecular orientation, contamination thickness, and oxide layer thickness. Elemental composition of regions shown in micrographs is obtained through energy‑ and wavelength‑dispersive X‑ray spectroscopies. Clients span research institutions, design firms, and military suppliers.
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